SEGATE: Unveiling Semantic Inconsistencies between Code and Specification of String Inputs
Automated testing techniques are often assessed on coverage based metrics. However, despite giving good coverage, the test cases may miss the gap between functional specification and the code implementation. This gap may be subtle in nature, arising due to the absence of logical checks, either in the implementation or in the specification, resulting in inconsistencies in the input definition. The inconsistencies may be prevalent especially for structured inputs, commonly specified using string-based data types. Our study on defects reported over popular libraries reveals that such gaps may not be limited to input validation checks. We propose a test generation technique for structured string inputs where we infer inconsistencies in input definition to expose semantic gaps in the method under test and the method specification. We assess this technique using our tool SEGATE, Semantic Gap Tester. SEGATE uses static analysis and automaton modeling to infer the gap and generate test cases. On our benchmark dataset, comprising of defects reported in 15 popular open-source libraries, written in Java, SEGATE was able to generate tests to expose 80% of the defects.
Tue 12 NovDisplayed time zone: Tijuana, Baja California change
13:40 - 15:20 | Testing and VerificationResearch Papers / Demonstrations / Industry Showcase at Cortez 1 Chair(s): Weihang Wang University at Buffalo, SUNY | ||
13:40 20mTalk | Systematically Covering Input Structure Research Papers Nikolas Havrikov CISPA Helmholtz Center for Information Security, Andreas Zeller CISPA Helmholtz Center for Information Security Pre-print | ||
14:00 20mTalk | SEGATE: Unveiling Semantic Inconsistencies between Code and Specification of String Inputs Research Papers Pre-print | ||
14:20 20mTalk | Detecting Error-Handling Bugs without Error Specification Input Research Papers Zhouyang Jia National University of Defense Technology, Shanshan Li National University of Defense Technology, Tingting Yu University of Kentucky, Liao Xiangke National University of Defense Technology, China, Ji Wang National University of Defense Technology, Xiaodong Liu National University of Defense Technology, Yunhuai Liu Peking University | ||
14:40 20mTalk | Test Automation and its Limitations Industry Showcase Ahyoung Sung Samsung Electronics, Yangsu Kim Samsung Electronics, Sangjun Kim Samsung Electronics, Jongin Kim Samsung Electronics, Neo Jang Samsung Electronics | ||
15:00 10mTalk | Grading-Based Test Suite Augmentation Research Papers Jonathan Osei-Owusu University of Illinois at Urbana-Champaign, Angello Astorga University of Illinois at Urbana-Champaign, Liia Butler University of Illinois at Urbana-Champaign, Tao Xie Peking University, Geoffrey Challen University of Illinois at Urbana-Champaign | ||
15:10 10mDemonstration | MutAPK: Source-Codeless Mutant Generation for Android Apps Demonstrations Camilo Escobar-Velásquez Universidad de los Andes, Michael Osorio-Riaño Universidad de los Andes, Mario Linares-Vásquez Systems and Computing Engineering Department , Universidad de los Andes , Bogotá, Colombia |