Detecting Error-Handling Bugs without Error Specification Input
Most software systems frequently encounter errors when interacting with their environments. When errors occur, error-handling code must execute flawlessly to facilitate system recovery. Implementing correct error handling is repetitive but non-trivial, and developers often inadvertently introduce bugs into error-handling code. Existing tools require correct error specifications to detect error-handling bugs. Manually generating error specifications is error-prone and tedious, while automatically mining error specifications is hard to achieve a satisfying accuracy. In this paper, we propose EH-Miner, a novel and practical tool that can automatically detect error-handling bugs without the need for error specifications. Given a function, EH-Miner mines its error-handling rules when the function is frequently checked by an equivalent condition, and handled by the same action. We applied EH-Miner to 117 mature applications across 15 software domains. EH-Miner mined error-handling rules with the precision rate of 91.1% and the recall rate of 46.9%. We reported 142 bugs to developers, and 106 bugs had been confirmed and fixed at the time of writing. We further applied EH-Miner to Linux kernel, and reported 68 bugs for kernel-4.17, of which 42 had been confirmed.
Tue 12 NovDisplayed time zone: Tijuana, Baja California change
13:40 - 15:20 | Testing and VerificationResearch Papers / Demonstrations / Industry Showcase at Cortez 1 Chair(s): Weihang Wang University at Buffalo, SUNY | ||
13:40 20mTalk | Systematically Covering Input Structure Research Papers Nikolas Havrikov CISPA Helmholtz Center for Information Security, Andreas Zeller CISPA Helmholtz Center for Information Security Pre-print | ||
14:00 20mTalk | SEGATE: Unveiling Semantic Inconsistencies between Code and Specification of String Inputs Research Papers Pre-print | ||
14:20 20mTalk | Detecting Error-Handling Bugs without Error Specification Input Research Papers Zhouyang Jia National University of Defense Technology, Shanshan Li National University of Defense Technology, Tingting Yu University of Kentucky, Liao Xiangke National University of Defense Technology, China, Ji Wang National University of Defense Technology, Xiaodong Liu National University of Defense Technology, Yunhuai Liu Peking University | ||
14:40 20mTalk | Test Automation and its Limitations Industry Showcase Ahyoung Sung Samsung Electronics, Yangsu Kim Samsung Electronics, Sangjun Kim Samsung Electronics, Jongin Kim Samsung Electronics, Neo Jang Samsung Electronics | ||
15:00 10mTalk | Grading-Based Test Suite Augmentation Research Papers Jonathan Osei-Owusu University of Illinois at Urbana-Champaign, Angello Astorga University of Illinois at Urbana-Champaign, Liia Butler University of Illinois at Urbana-Champaign, Tao Xie Peking University, Geoffrey Challen University of Illinois at Urbana-Champaign | ||
15:10 10mDemonstration | MutAPK: Source-Codeless Mutant Generation for Android Apps Demonstrations Camilo Escobar-Velásquez Universidad de los Andes, Michael Osorio-Riaño Universidad de los Andes, Mario Linares-Vásquez Systems and Computing Engineering Department , Universidad de los Andes , Bogotá, Colombia |